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The MDIC-100 reflected light differential interference contrast microscope is designed for high performance and cost ratio purpose. Equipped with infinity optical system and built-in high brightness LED inllumination, it is provided with DIC observational functions. It is suitable for microscopic morphology observation of non-transparent material serface, such as microscopic morphology of LCD conductive particles. This microscope is an ideal instrument for quality instpection, structure analysis of precision manufacturing.

 

Features:

 

  • High performance and cost ratio

  • Ergonomic design, low location of coaxial focus system

  • Wide field, excellent image and high resulition

  • Double layer mechanism stage

Metallurgical Microscope MDIC-100 (Differential  Interference Contrast)

Diagram
Dimensions
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