The MDIC-100 reflected light differential interference contrast microscope is designed for high performance and cost ratio purpose. Equipped with infinity optical system and built-in high brightness LED inllumination, it is provided with DIC observational functions. It is suitable for microscopic morphology observation of non-transparent material serface, such as microscopic morphology of LCD conductive particles. This microscope is an ideal instrument for quality instpection, structure analysis of precision manufacturing.
High performance and cost ratio
Ergonomic design, low location of coaxial focus system
Wide field, excellent image and high resulition
Double layer mechanism stage